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Atomic force microscope LAFM-A11 Catalog

Atomic force microscope LAFM-A11

Atomic force microscope LAFM-A11

Overview

Atomic force microscope LAFM-A11 comes with combined design of scan head and sample stage, to give strong anti-vibration performance. Adopted with servomotor, drives the sample approaching tip manually or automatically, to evaluate precise scanning area position. Equipped with precision laser detection and probe alignment device, make easy adjustment of laser beam.

Features

  • - Large sample transfer range
    Optical observation system for checking tip & sample’s position
    Modular electronic system for easy maintenance
    CCD observing system
    Equipped with servomotor to achieve CCD auto focusing
    Provides highly accurate results
Specifications
Operation modesContact mode, friction mode, extended modes of tapping phase, MFM, EFM, scan angle 0 to 360°
Scan angle0 to 360°
Maximum scan rangeX/Y axis: 50 µm, Z axis: 5 µm
Optical system/ Magnification of CCDMagnification: 10x, Resolution: 1 µm
ResolutionX/Y axis: 0.2 nm, Z axis: 0.05 nm
Sample sizeØ≤ 90 mm, H≤ 20 mm
Sample movement0 to 20 mm
Pulse width of approaching motor10 ± 2 ms
Scan rate0.6 Hz to 4.34 Hz
Scanning controlXY: 18 bit D/A & double 16 bit A/D multiple channel simultaneously
Types of sampling pixel256×256, 512×512
Feedback typeDSP digital feedback
Feedback sampling rate64 KHz
PC connections:USB 2.0
Windows softwareCompatible with windows 98/2000/XP/7/8
Instrument Diemnsion700 × 500 × 460 mm
Net weight50 kg
Gross Weight87.4 kg
Applications :

It finds best solution for applications in biochemistry for tissues, cells, cellular components imaging, nanotechnology for imaging of polymers, nanomaterials, and in chemistry physics for imaging of surface metals elements.

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