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Atomic force microscope LAFM-A10 comes with combined design of scan head and sample stage so as to give strong anti-vibration performance. It’s equipped with precision laser detection and probe alignment device for simple & easy adjustment of laser beam.
It finds best solution for applications in biochemistry for tissues, cells, cellular components imaging, nanotechnology for imaging of polymers, nanomaterials, and in chemistry physics for imaging of surface metals elements.
Operation modes | Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle |
Scan angle | Random angle |
Maximum scan range | X/Y axis: 20 µm, Z axis: 2 µm |
Optical system/ Magnification of CCD | Magnification: 4x, Resolution: 2.5 µm |
Operation modes | Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle |
Scan angle | Random angle |
Maximum scan range | X/Y axis: 20 µm, Z axis: 2 µm |
Optical system/ Magnification of CCD | Magnification: 4x, Resolution: 2.5 µm |
Operation modes | Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle |
Scan angle | Random angle |
Maximum scan range | X/Y axis: 20 µm, Z axis: 2 µm |
Optical system/ Magnification of CCD | Magnification: 4x, Resolution: 2.5 µm |
Operation modes | Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle |
Scan angle | Random angle |
Maximum scan range | X/Y axis: 20 µm, Z axis: 2 µm |
Optical system/ Magnification of CCD | Magnification: 4x, Resolution: 2.5 µm |
Operation modes | Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle |
Scan angle | Random angle |
Maximum scan range | X/Y axis: 20 µm, Z axis: 2 µm |
Optical system/ Magnification of CCD | Magnification: 4x, Resolution: 2.5 µm |
Operation modes | Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle |
Scan angle | Random angle |
Maximum scan range | X/Y axis: 20 µm, Z axis: 2 µm |
Optical system/ Magnification of CCD | Magnification: 4x, Resolution: 2.5 µm |
Operation modes | Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle |
Scan angle | Random angle |
Maximum scan range | X/Y axis: 20 µm, Z axis: 2 µm |
Optical system/ Magnification of CCD | Magnification: 4x, Resolution: 2.5 µm |
Operation modes | Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle |
Scan angle | Random angle |
Maximum scan range | X/Y axis: 20 µm, Z axis: 2 µm |
Optical system/ Magnification of CCD | Magnification: 4x, Resolution: 2.5 µm |
Operation modes | Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle |
Scan angle | Random angle |
Maximum scan range | X/Y axis: 20 µm, Z axis: 2 µm |
Optical system/ Magnification of CCD | Magnification: 4x, Resolution: 2.5 µm |
Operation modes | Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle |
Scan angle | Random angle |
Maximum scan range | X/Y axis: 20 µm, Z axis: 2 µm |
Optical system/ Magnification of CCD | Magnification: 4x, Resolution: 2.5 µm |
Operation modes | Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle |
Scan angle | Random angle |
Maximum scan range | X/Y axis: 20 µm, Z axis: 2 µm |
Optical system/ Magnification of CCD | Magnification: 4x, Resolution: 2.5 µm |
Operation modes | Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle |
Scan angle | Random angle |
Maximum scan range | X/Y axis: 20 µm, Z axis: 2 µm |
Optical system/ Magnification of CCD | Magnification: 4x, Resolution: 2.5 µm |
Operation modes | Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle |
Scan angle | Random angle |
Maximum scan range | X/Y axis: 20 µm, Z axis: 2 µm |
Optical system/ Magnification of CCD | Magnification: 4x, Resolution: 2.5 µm |
Operation modes | Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle |
Scan angle | Random angle |
Maximum scan range | X/Y axis: 20 µm, Z axis: 2 µm |
Optical system/ Magnification of CCD | Magnification: 4x, Resolution: 2.5 µm |
Operation modes | Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle |
Scan angle | Random angle |
Maximum scan range | X/Y axis: 20 µm, Z axis: 2 µm |
Optical system/ Magnification of CCD | Magnification: 4x, Resolution: 2.5 µm |
Operation modes | Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle |
Scan angle | Random angle |
Maximum scan range | X/Y axis: 20 µm, Z axis: 2 µm |
Optical system/ Magnification of CCD | Magnification: 4x, Resolution: 2.5 µm |
Operation modes | Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle |
Scan angle | Random angle |
Maximum scan range | X/Y axis: 20 µm, Z axis: 2 µm |
Optical system/ Magnification of CCD | Magnification: 4x, Resolution: 2.5 µm |
Operation modes | Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle |
Scan angle | Random angle |
Maximum scan range | X/Y axis: 20 µm, Z axis: 2 µm |
Optical system/ Magnification of CCD | Magnification: 4x, Resolution: 2.5 µm |
Operation modes | Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle |
Scan angle | Random angle |
Maximum scan range | X/Y axis: 20 µm, Z axis: 2 µm |
Optical system/ Magnification of CCD | Magnification: 4x, Resolution: 2.5 µm |
Operation modes | Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle |
Scan angle | Random angle |
Maximum scan range | X/Y axis: 20 µm, Z axis: 2 µm |
Optical system/ Magnification of CCD | Magnification: 4x, Resolution: 2.5 µm |
Operation modes | Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle |
Scan angle | Random angle |
Maximum scan range | X/Y axis: 20 µm, Z axis: 2 µm |
Optical system/ Magnification of CCD | Magnification: 4x, Resolution: 2.5 µm |
Operation modes | Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle |
Scan angle | Random angle |
Maximum scan range | X/Y axis: 20 µm, Z axis: 2 µm |
Optical system/ Magnification of CCD | Magnification: 4x, Resolution: 2.5 µm |
Operation modes | Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle |
Scan angle | Random angle |
Maximum scan range | X/Y axis: 20 µm, Z axis: 2 µm |
Optical system/ Magnification of CCD | Magnification: 4x, Resolution: 2.5 µm |
Operation modes | Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle |
Scan angle | Random angle |
Maximum scan range | X/Y axis: 20 µm, Z axis: 2 µm |
Optical system/ Magnification of CCD | Magnification: 4x, Resolution: 2.5 µm |
Operation modes | Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle |
Scan angle | Random angle |
Maximum scan range | X/Y axis: 20 µm, Z axis: 2 µm |
Optical system/ Magnification of CCD | Magnification: 4x, Resolution: 2.5 µm |
Operation modes | Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle |
Scan angle | Random angle |
Maximum scan range | X/Y axis: 20 µm, Z axis: 2 µm |
Optical system/ Magnification of CCD | Magnification: 4x, Resolution: 2.5 µm |
Operation modes | Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle |
Scan angle | Random angle |
Maximum scan range | X/Y axis: 20 µm, Z axis: 2 µm |
Optical system/ Magnification of CCD | Magnification: 4x, Resolution: 2.5 µm |
Operation modes | Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle |
Scan angle | Random angle |
Maximum scan range | X/Y axis: 20 µm, Z axis: 2 µm |
Optical system/ Magnification of CCD | Magnification: 4x, Resolution: 2.5 µm |
Operation modes | Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle |
Scan angle | Random angle |
Maximum scan range | X/Y axis: 20 µm, Z axis: 2 µm |
Optical system/ Magnification of CCD | Magnification: 4x, Resolution: 2.5 µm |
Operation modes | Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle |
Scan angle | Random angle |
Maximum scan range | X/Y axis: 20 µm, Z axis: 2 µm |
Optical system/ Magnification of CCD | Magnification: 4x, Resolution: 2.5 µm |
Operation modes | Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle |
Scan angle | Random angle |
Maximum scan range | X/Y axis: 20 µm, Z axis: 2 µm |
Optical system/ Magnification of CCD | Magnification: 4x, Resolution: 2.5 µm |
Operation modes | Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle |
Scan angle | Random angle |
Maximum scan range | X/Y axis: 20 µm, Z axis: 2 µm |
Optical system/ Magnification of CCD | Magnification: 4x, Resolution: 2.5 µm |
Operation modes | Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle |
Scan angle | Random angle |
Maximum scan range | X/Y axis: 20 µm, Z axis: 2 µm |
Optical system/ Magnification of CCD | Magnification: 4x, Resolution: 2.5 µm |
Operation modes | Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle |
Scan angle | Random angle |
Maximum scan range | X/Y axis: 20 µm, Z axis: 2 µm |
Optical system/ Magnification of CCD | Magnification: 4x, Resolution: 2.5 µm |
Operation modes | Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle |
Scan angle | Random angle |
Maximum scan range | X/Y axis: 20 µm, Z axis: 2 µm |
Optical system/ Magnification of CCD | Magnification: 4x, Resolution: 2.5 µm |
Operation modes | Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle |
Scan angle | Random angle |
Maximum scan range | X/Y axis: 20 µm, Z axis: 2 µm |
Optical system/ Magnification of CCD | Magnification: 4x, Resolution: 2.5 µm |
Operation modes | Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle |
Scan angle | Random angle |
Maximum scan range | X/Y axis: 20 µm, Z axis: 2 µm |
Optical system/ Magnification of CCD | Magnification: 4x, Resolution: 2.5 µm |