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Atomic force microscope LAFM-A10

Atomic force microscope LAFM-A10 comes with combined design of scan head and sample stage so as to give strong anti-vibration performance. It’s equipped with precision laser detection and probe alignment device for simple & easy adjustment of laser beam.

Atomic force microscope LAFM-A10

Operation modes Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle
Scan angle Random angle
Maximum scan range X/Y axis: 20 µm, Z axis: 2 µm
Optical system/ Magnification of CCD Magnification: 4x, Resolution: 2.5 µm
Resolution X/Y axis: 0.2 nm, Z axis: 0.05 nm
Sample size Ø≤ 90 mm, H≤ 20 mm
Sample movement 0 to 20 mm
Pulse width of approaching motor 10 ± 2 ms
Scan rate 0.6 Hz to 4.34 Hz
Scanning control XY: 18 bit D/A & double 16 bit A/D multiple channel simultaneously
Types of sampling pixel 256×256, 512×512
Feedback type DSP digital feedback
Feedback sampling rate 64 KHz
PC connections: USB 2.0
Windows software Compatible with windows 98/2000/XP/7/8
Instrument Diemnsion 415 × 410 × 545 mm
Net weight 40 kg
Gross Weight 50 kg

  • Large range of sample transfer
    Modular electronic system for easy maintenance
    Adopted with spring for vibration isolation
    Provides highly accurate results
    Optical observation system for checking tip & sample’s position

It finds best solution for applications in biochemistry for tissues, cells, cellular components imaging, nanotechnology for imaging of polymers, nanomaterials, and in chemistry physics for imaging of surface metals elements.

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