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Atomic force microscope LAFM-A11

Atomic force microscope LAFM-A11 comes with combined design of scan head and sample stage, to give strong anti-vibration performance. Adopted with servomotor, drives the sample approaching tip manually or automatically, to evaluate precise scanning area position. Equipped with precision laser detection and probe alignment device, make easy adjustment of laser beam.

Atomic force microscope LAFM-A11

Operation modes Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scan angle 0 to 360°
Scan angle 0 to 360°
Maximum scan range X/Y axis: 50 µm, Z axis: 5 µm
Optical system/ Magnification of CCD Magnification: 10x, Resolution: 1 µm
Resolution X/Y axis: 0.2 nm, Z axis: 0.05 nm
Sample size Ø≤ 90 mm, H≤ 20 mm
Sample movement 0 to 20 mm
Pulse width of approaching motor 10 ± 2 ms
Scan rate 0.6 Hz to 4.34 Hz
Scanning control XY: 18 bit D/A & double 16 bit A/D multiple channel simultaneously
Types of sampling pixel 256×256, 512×512
Feedback type DSP digital feedback
Feedback sampling rate 64 KHz
PC connections: USB 2.0
Windows software Compatible with windows 98/2000/XP/7/8
Instrument Diemnsion 700 × 500 × 460 mm
Net weight 50 kg
Gross Weight 87.4 kg

  • Large sample transfer range
    Optical observation system for checking tip & sample’s position
    Modular electronic system for easy maintenance
    CCD observing system
    Equipped with servomotor to achieve CCD auto focusing
    Provides highly accurate results

It finds best solution for applications in biochemistry for tissues, cells, cellular components imaging, nanotechnology for imaging of polymers, nanomaterials, and in chemistry physics for imaging of surface metals elements.

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