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XRD Diffractometer LXRD-A10

XRD Diffractometer LXRD-A10 contains tube current up to 5 to 80 mA with a dimension 1 × 10 mm/ 0.4 × 14 mm/ 2 × 12 mm and are designed for quality diffraction data, combined with ease of use and flexibility to quickly switch to different applications, This multipurpose diffractometers are all equipped with X-ray tuble of glass tube, ceramic tube, ripple ceramic tube with many different X-ray source materials (Cu, Fe, Co, Cr and Mo) and is coupled with an auto-switching dual wavelength optic. It have Low maintenance, high performance system and designed with Horizontal Goniometer structure and proportional/Scintillation counters detector.

XRD Diffractometer LXRD-A10

X-ray Tuble Glass tube, Ceramic tube, Ripple Ceramic tube: Cu, Fe, Co, Cr, Mo etc., Power 2 kW
Focus Size 1 × 10 mm/ 0.4 × 14 mm/ 2 × 12 mm
Stability ≤ 0.01 %
Tube Current 5 to 80 mA
Tube Voltage 10 to 60 kV
Rated Power 3 kW
Goniometer Structure Horizontal (Ø to 2 Ø )
Radius of Diffraction 185 mm
Scanning Range 0 to 164
Scanning Speed 0.0012º to 70 º min
Maximum Resolving Speed 100 º / min
Scanning Mode Ø to 2 Ø linkage, Ø, 2 Ø single action; continuous/stepping scanning
Angle Repeatable Accuracy 1 / 1000 º
Minimal Stepping Angle 1 / 1000 º
Detector Proportional/Scintillation counters
Maximum Counting rate of Linearity 5 × 105 CPS (with the compensate function of dropout counting)
Energy Resolution Ratio ≤ 25 % (PC), ≤ 50 % (SC)
Counting Fashion Differential Coefficient / integral, PHA automatically, Dead time regulate
Stability of System measure ≤ 0.01 %
Scattered Rays Dose ≤ 1 µ Sv/h (without X-ray protective device)
Instrument Integrative Stability ≤ 0.5 %
Dimension 1100 × 850 × 1750 mm
Weight About 25 kg

  • Diffractometer is equipped with X-ray tuble of glass tube, ceramic tube, and ripple ceramic tube with many different X-ray source materials (Cu, Fe, Co, Cr and Mo)
    Coupled with an auto-switching dual wavelength optic
    Horizontal Goniometer structure
    Proportional/Scintillation counters detector
    For testing unknown samples it has phase identification and phase analysis for known mixed samples
    Crystal structure varies with temperature (high temperature vice versa) factor and chemical information tested by X-ray diffraction test device
    Equipped with programmable operation, integrated structure design with easy operation and well-designed outlook
    High throughput with high accuracy diffraction angle measurement
    Scanning range and Scanning speed are well design in equipment

Best suited for the research and industrial product analysis with perfect combination of conventional analysis crucial measurement product and for academics and researchers in different application areas.

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