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XRF-Spectrometer LXRF-A10 is a microprocessor controlled high-count throughput unit with low detection limits for wide range of elements. Provision of multi-elemental analysis with detection limits upto 1 ppm. Built-in movable platform for easy location of testing point.High resolution detector improves analysis accuracy. Equipped with safety features of optical tube shielding with no X-ray radiation and high voltage emergency locking.
Used in detection of plating thickness of metals, concentration of plating solution , RoHS detection and analysis, full-element analysis and electro plating industries
| Measureable elements | S to U |
| Detection limit | 1 ppm |
| Temperature | 15 ~ 30 °C |
| Elemental content | 1 ppm to 99 % |
| Measureable elements | S to U |
| Detection limit | 1 ppm |
| Temperature | 15 ~ 30 °C |
| Elemental content | 1 ppm to 99 % |
| Measureable elements | S to U |
| Detection limit | 1 ppm |
| Temperature | 15 ~ 30 °C |
| Elemental content | 1 ppm to 99 % |
| Measureable elements | S to U |
| Detection limit | 1 ppm |
| Temperature | 15 ~ 30 °C |
| Elemental content | 1 ppm to 99 % |
| Measureable elements | S to U |
| Detection limit | 1 ppm |
| Temperature | 15 ~ 30 °C |
| Elemental content | 1 ppm to 99 % |
| Measureable elements | S to U |
| Detection limit | 1 ppm |
| Temperature | 15 ~ 30 °C |
| Elemental content | 1 ppm to 99 % |
| Measureable elements | S to U |
| Detection limit | 1 ppm |
| Temperature | 15 ~ 30 °C |
| Elemental content | 1 ppm to 99 % |
| Measureable elements | S to U |
| Detection limit | 1 ppm |
| Temperature | 15 ~ 30 °C |
| Elemental content | 1 ppm to 99 % |
| Measureable elements | S to U |
| Detection limit | 1 ppm |
| Temperature | 15 ~ 30 °C |
| Elemental content | 1 ppm to 99 % |
| Measureable elements | S to U |
| Detection limit | 1 ppm |
| Temperature | 15 ~ 30 °C |
| Elemental content | 1 ppm to 99 % |